Getting Started

Introduction

Thin-Film Optics and OLED Emission Simulation

Dreapex TMM is an optical simulation platform
for planar multilayer structures. It calculates two physical processes:

  1. External light propagating through multilayers (optical coatings, filters, photodetectors, photovoltaics, and related devices).
  2. Emission from light-emitting layers inside multilayers (OLEDs, QLEDs, PeLEDs, and related devices).

Open Dreapex TMM (https://tmm.dreapex.com) in your browser, click a built-in case in Cases, and start simulating.

3D view of a DBR periodic multilayer structure in Dreapex TMM
3D view of a DBR periodic multilayer structure

Four Core Application Areas

Optical Coatings and Filters

Three interference filters showing different transmitted and reflected colors
Interference filtersNASA / JPL / Wikimedia CommonsPublic Domain (NASA)

Antireflection coatings, high reflectors, beamsplitters, bandpass filters, and narrowband filters: compare reflection, transmission, and absorption across wavelength, angle, and polarization to verify passbands, stopbands, and cut-off edges. More scenarios.

Photovoltaic and Photodetector Devices

Outdoor photovoltaic modules
Photovoltaic modulesMarkBuckawicki / Wikimedia CommonsCC0 1.0

Solar cells, photodiodes, and multilayer detectors: calculate layer absorption, electric field, energy flow, and absorption density to separate active-layer contribution from parasitic loss. More scenarios.

OLED, QLED, and PeLED Devices

Red, green, and blue emissive subpixels in an AMOLED display
AMOLED emissive subpixelsBautsch / Wikimedia CommonsCC0 1.0

Bottom- and top-emitting OLEDs, QLEDs, and PeLEDs: calculate emission spectra, angular distributions, viewing-angle color shift, and power channels to locate waveguide, surface-plasmon, absorption, and non-radiative losses. More scenarios.

Thin-Film Metrology and Optical Sensing

A silicon wafer used to manufacture and measure thin-film devices
Silicon waferInductiveload / Wikimedia CommonsPublic Domain

Ellipsometry, film-thickness retrieval, and resonant sensors: calculate Ψ, Δ, and resonance wavelength to evaluate changes in thickness, material properties, or ambient refractive index. More scenarios.

Simulation Result Examples

Propagation Results

Transmittance spectrum of a Fabry–Pérot narrowband filter calculated by Dreapex TMM
Transmittance spectrum of a Fabry–Pérot narrowband filterSource article: Fabry–Pérot Narrowband Filter
Layer absorption of an amorphous-silicon solar cell calculated by Dreapex TMM
Layer absorption in a solar cellSource article: a-Si Solar-Cell Absorption
Electric-field depth distribution inside a solar cell calculated by Dreapex TMM
Electric-field distribution inside a solar cellSource article: a-Si Solar-Cell Depth Analysis
Ellipsometric Psi spectra at different film thicknesses calculated by Dreapex TMM
Ellipsometric Ψ as film thickness changesSource article: Introduction to Ellipsometry

Emission Results

Normalized emission spectra at different angles for a top-emitting OLED calculated by Dreapex TMM
Angle-dependent emission spectra of a top-emitting OLEDSource article: Emission Modeling
Normalized angular distribution of a top-emitting OLED calculated by Dreapex TMM
Angular emission distribution of a top-emitting OLEDSource article: Emission Modeling
CIE 1931 chromaticity coordinates at different viewing angles for a top-emitting OLED calculated by Dreapex TMM
Viewing-angle color shift of a top-emitting OLEDSource article: Emission Color Results
Power dissipation versus wavelength and effective index for a top-emitting OLED calculated by Dreapex TMM
Power-dissipation map of a top-emitting OLEDSource article: Power Dissipation Results
Optical-mode and loss fractions of an OLED calculated by Dreapex TMM
Optical modes and loss fractions of an OLEDSource article: Emission Modeling

Sweep and Optimization

Sweeps show how results change with a parameter; optimization finds the best design for a specified target.

Parameter Sweep

Multiple Fabry-Pérot transmittance spectra from a parameter sweep in Dreapex TMM
Transmission peak shift during a cavity-thickness sweepSource article: Fabry–Pérot Sensitivity Analysis
3D scatter plot of electric-field depth distribution over wavelength and ITO thickness in Dreapex TMM
Electric-field depth distribution in a 3D scatter plotSource article: Depth Detector Analysis
Top-outcoupling mode heatmap from a two-layer cavity-thickness sweep in Dreapex TMM
Top-outcoupling mode heatmap from a two-layer QLED cavity sweepSource article: Tandem QLED Cavity Optimization

Target-Driven Optimization

Solar-cell absorption optimization report in Dreapex TMM
Solar-cell absorption optimization reportSource article: a-Si Solar-Cell Absorption

Why Choose Dreapex TMM

Comprehensive Simulation

Detectors combine freely, and one run returns all of their results — no re-running the same simulation for each one.Tuning an OLED microcavity is the typical case: change the cavity length and the spectral peak, the angular color shift, and the outcoupling efficiency all move together, so they have to be weighed together. Select Intensity and Mode, sweep the electron-transport-layer thickness once, and every thickness returns its spectrum and its seven channel fractions at the same time, ready to compare in one set of data. Add Power Dissipation and it comes from that same single run. See Tandem QLED Cavity Optimization for the full procedure.
Simulation typeLight sourceApplicable devicesSupported results
PropagationExternal incident plane waveOptical coatings, filters, absorbers, photovoltaics, photodetectors, metrology, and sensing devicesR / T / A and layer absorption; reflection / transmission / absorption spectra and CIE color; swept-color L*a*b*, C*ab, h_ab, and ΔE00; Ψ / Δ; reflection / transmission Phase, GD, GDD, and DGD; depth-resolved electric field, refractive index, normalized Poynting vector, and absorption density
EmissionDipoles inside an emitting layerPlanar OLED, QLED, PeLED, and related emissive devicesPower dissipation; raw / normalized emission spectra and angular distributions; CIE emission color; peak intensity, peak wavelength, and envelope FWHM; top outcoupling, bottom outcoupling, substrate, waveguide, evanescent, absorption, and non-radiative channels; Purcell factor, decay-rate enhancement, effective quantum efficiency, and lifetime

Easy to Learn

  • No installation. Open the cloud platform and start.
  • A clear workflow replaces cluttered pop-up windows; build the model and inspect results in one workspace.
  • Real-time parameter validation reduces interrupted runs and keeps work moving.
  • A built-in refractive-index database and case library accelerate model setup.
  • Multilingual documentation takes you from the first simulation to advanced analysis.
Charts respond instantly: move the pointer onto a curve and the wavelength and value at that point appear immediately, with no waiting.A sweep often leaves a dozen overlapping curves. Tracing the pointer along a curve reads out values continuously, which locates a peak, a crossing point, or the spread between curves at one wavelength in seconds. For exact numbers, switch to the table view and sort by any column or filter by wavelength to bring the rows worth comparing together.
Dreapex TMM structure view with one DBR Stack group and BK7 glass as the bottom medium
An intuitive interface for a fast start

Fast Computation

  • High-speed cloud computing keeps local machines responsive and cool.
  • Parallel sweeps process large numbers of parameter combinations quickly.
  • Optimization algorithms automatically search for the best parameters.
Everything is computed in the cloud. No local CPU or memory is used, so even a large sweep leaves a laptop responsive and cool.Cavity-length optimization often sweeps two layer thicknesses at once, and 20 points each already makes 400 structures. Those 400 are computed in parallel across multiple cloud cores; set the parallel count with Concurrent Requests in Settings, up to 32.

AI Services and Open Data

  • Modify models, run simulations, and read results with the in-app AI Assistant.
  • Get answers and operating guidance from AI inside the documentation.
  • Connect AI agents through MCP to automate the full modeling, sweep, optimization, and reporting workflow.
  • Models use open JSON, and results use CSV, so local software and AI can read them.
  • We believe your data belongs entirely to you. We will not bind it to proprietary formats, and you can leave Dreapex TMM at any time.

Open Dreapex TMM and run your first simulation.

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