Getting Started

Introduction

Dreapex TMM covers thin-film propagation and emission simulation for planar multilayer structures, plus parameter sweeps and target-driven optimization.

Dreapex TMM is an online optical simulation platform for planar multilayer structures. It calculates two physical processes:

Propagation of external light through multilayers (optical coatings, filters, photodetectors, photovoltaics, and related devices).
Outward emission from sources inside a layer (OLEDs, QLEDs, PeLEDs, and related devices).

For a planar multilayer structure, open Dreapex TMM in a browser and define the materials, layer order, and thicknesses to calculate spectra, field distributions, emission, and optical loss.

Dreapex TMM structure view with one DBR Stack group and BK7 glass as the bottom medium — An intuitive workspace for fast simulation setup

Four Core Application Areas

Optical Coatings and Filters

Three interference filters showing different transmitted and reflected colors — Interference filtersNASA / JPL / Wikimedia Commons Public Domain (NASA)

Antireflection coatings, high reflectors, beamsplitters, bandpass filters, and narrowband filters: compare reflection, transmission, and absorption across wavelength, angle, and polarization to verify passbands, stopbands, and cut-off edges. More scenarios.

Photovoltaic and Photodetector Devices

Outdoor photovoltaic modules — Photovoltaic modulesMarkBuckawicki / Wikimedia Commons CC0 1.0

Solar cells, photodiodes, and multilayer detectors: calculate layer absorption, electric field, energy flow, and absorption density to separate active-layer contribution from parasitic loss. More scenarios.

OLED, QLED, and PeLED Devices

Red, green, and blue emissive subpixels in an AMOLED display — AMOLED emissive subpixelsBautsch / Wikimedia Commons CC0 1.0

Bottom- and top-emitting OLEDs, QLEDs, and PeLEDs: calculate emission spectra, angular distributions, viewing-angle color shift, and power channels to locate waveguide, surface-plasmon, absorption, and non-radiative losses. More scenarios.

Thin-Film Metrology and Optical Sensing

A silicon wafer used to manufacture and measure thin-film devices — Silicon waferInductiveload / Wikimedia Commons Public Domain

Ellipsometry, film-thickness retrieval, and resonant sensors: calculate Ψ, Δ, and resonance wavelength to evaluate changes in thickness, material properties, or ambient refractive index. More scenarios.

Simulation Result Examples

Reflectance, Transmittance, and Absorptance Spectra

Reflectance spectrum of a 45-degree dichroic beamsplitter calculated by Dreapex TMM — Reflectance spectrum of a 45° dichroic beamsplitter

Layer Absorption and Internal Fields

Localized electric field at a metal and DBR interface calculated by Dreapex TMM — Localized electric field at a metal–DBR interface

Emission Spectra and Angular Distribution

Normalized angular distribution of a top-emitting OLED calculated by Dreapex TMM — Angular emission distribution of a top-emitting OLED

Optical Modes and Loss Fractions

Optical-mode and loss fractions of an OLED calculated by Dreapex TMM — Optical modes and loss fractions of an OLED

From Results to Design

Sweeps show how results change with a parameter; optimization finds the best design for a specified target.

Parameter Sweep

Multiple Fabry-Pérot transmittance spectra from a parameter sweep in Dreapex TMM — Transmission peak shift during a cavity-thickness sweep

Target-Driven Optimization

Solar-cell absorption optimization report in Dreapex TMM — Solar-cell absorption optimization report

Open Dreapex TMM and run your first simulation.

Quick Start

Build a DBR structure and complete your first calculation