Overview
Algorithm Validation contains independent calculations performed with controlled inputs. Unlike Case Studies, which reproduce application scenarios from published research, this section fixes material dispersion, layer structure, boundary conditions, sampling, and optimization targets to test whether independent software produces consistent spectra and design results.
| Validation | Independent reference | Comparison | Main result |
|---|---|---|---|
| Four-Layer Broadband AR Cross-Validation | Essential Macleod | 400–700 nm forward reflectance and four-layer thickness optimization | Overlapping spectra; maximum optimized-thickness difference of 0.782% |
Each validation record provides the shared inputs, configuration evidence from both programs, original outputs, and acceptance criteria. Agreement applies only to the stated model scope and inputs; it does not replace measurement, fabrication-tolerance analysis, or material-uncertainty analysis.
The recommended review sequence is to confirm the shared inputs, inspect the forward-calculation comparison, and then compare the optimization objective, variable bounds, and layer-by-layer thickness differences.
Micro-LED Far-Field Emission
Reproduce the angle- and wavelength-resolved far-field electroluminescence of a flip-chip InGaN/GaN micro-LED from Rol et al. (J. Soc. Inf. Display, 2025) in Dreapex TMM, using the Emission solver, and compare directly against Figures 3b, 4, and 5.
Four-Layer Broadband AR Cross-Validation
Compare Dreapex TMM with Essential Macleod using identical material dispersion, layer structures, boundary conditions, and optimization targets.