Separate Blue-Green and Red Light: Design a 45° Dichroic Beamsplitter
This tutorial extends the learning target from normal incidence to a 45° splitter: reflect blue-green light, transmit red light, and check s and p polarization separately. You will set oblique-incidence optics, define two spectral objectives, and judge the splitter from the optimization results.
| Band | Target | Validation quantity |
|---|---|---|
| 450–520 nm | Reflect blue-green | Maximize average reflectance |
| 521–619 nm | Allow the spectral transition | No objective |
| 620–700 nm | Transmit red | Maximize average transmittance |
Oblique Incidence Changes Optical Thickness
The propagation angle inside layer follows Snell's law:
Here, and are the refractive indices of the incident medium and layer ; is the external incidence angle; and is the refracted angle inside the layer. All angles are measured from the surface normal. The one-way phase thickness of that layer is
Here, is the phase thickness, is physical thickness, is the vacuum wavelength, and the other symbols retain their definitions above. As incidence angle increases, the change in shifts a normal-incidence quarter-wave condition. The s and p polarizations also have different interface reflection coefficients, so both must be checked for a 45° design.
Start from a Six-Pair Periodic Stack
The initial structure is : 56 nm TiO₂ followed by 100 nm MgF₂ and repeated six times, above a 1 mm incoherent glass substrate. Using only the two shared periodic thicknesses as variables exposes the trade-off between objectives without requiring twelve independent variables at once.
| Shared variable | Initial value | Allowed range | Optimized value |
|---|---|---|---|
| TiO₂ high-index layer | 56 nm | 25–80 nm | 25.000 nm |
| MgF₂ low-index layer | 100 nm | 70–140 nm | 137.618 nm |
After optimization, select Apply to Structure, return to Structure, and confirm that the two group thicknesses were updated while Repeat Count remains 6.

Click Edit Group. Confirm Repeat Count is 6, with 25.000 nm TiO₂ first and 137.618 nm MgF₂ second. The thickness fields use the displayed precision, while the preview uses the fuller internal value when calculating total thickness.

In Optics, set 400–750 nm with a 1 nm step, 45° incidence, and unpolarized light. The software represents the p-polarized fraction as pRatio: 0 is pure s, 1 is pure p, and 0.5 is an equal s/p average. Begin with 0.5 for unpolarized performance and enable Reflectance and Transmittance.

Translate the Specification into Two Objectives
Add two equally weighted objectives in Optimizer:
- maximize average
Reflectancefrom 450 to 520 nm with a 5 nm step, at 45° with unpolarized light; - maximize average
Transmittancefrom 620 to 700 nm with a 5 nm step, at 45° with unpolarized light.
Both objectives must use the same angle and polarization definition. Otherwise, the optimizer would balance two different operating conditions, and the compromise would not correspond to one physical device use case.

Choose Nelder–Mead, set 280 maximum evaluations, and use an initial simplex scale of 0.08. The real optimization converged after 102 objective evaluations. Its 5 nm sampled report gives 91.508% blue-green reflection and 90.678% red transmission. Apply the optimized thicknesses, then perform final validation with a finer 1 nm step.

Unpolarized Result
The 1 nm forward run gives 91.824% average reflectance over 450–520 nm, with a band minimum of 75.787% at 520 nm. Average transmittance over 620–700 nm is 90.915%, with a band minimum of 76.209% at 620 nm. Both minima occur at the edges nearest the transition region, consistent with a spectrum changing from reflection to transmission.


The initial stack is already a strong blue-green reflector, but its red transmission is inadequate. Optimization gives up some reflection margin to obtain much higher red transmission.
| Design | Average , 450–520 nm | Average , 620–700 nm | ||
|---|---|---|---|---|
| Initial 56/100 nm | 99.084% | 59.676% | — | — |
| Optimized 25.000/137.618 nm | 91.824% | 90.915% | 90.052% | 89.245% |
Validate s and p Separately
An unpolarized average can hide large differences between the polarizations. Keep the structure, wavelength range, and 45° incidence fixed; set pRatio to 0 and 1 in turn and run each case.
| Polarization | Average , 450–520 nm | Minimum in-band | Average , 620–700 nm |
|---|---|---|---|
| s | 98.820% | 96.568% | 84.763% |
| p | 84.828% | 55.005% | 97.067% |
| Unpolarized average | 91.824% | 75.787% | 90.915% |
The design meets this tutorial's unpolarized average objectives, but it is not a non-polarizing beamsplitter. The p-polarized blue-green response weakens strongly near the band edge, while s-polarized red transmission is below the unpolarized average. If an application requires both polarizations to meet the same threshold, add separate s and p objectives and allow more independent thickness variables.
The optimized TiO₂ thickness is exactly at its 25 nm lower bound, showing that the search still prefers a thinner layer. A next design iteration can widen that bound. If the deposition process imposes a 25 nm minimum, keep the bound and progressively unlock the twelve layers into independent or grouped variables. Reaching a bound is not a calculation failure; it identifies where structural freedom conflicts with a manufacturing constraint.
Common Errors and Recovery Order
| Symptom | Likely cause | Action |
|---|---|---|
| The spectrum resembles the normal-incidence DBR | The objective or forward run still uses 0° | Check 45° in both Optics and both optimization objectives |
| The average is good but one polarization fails | Only pRatio=0.5 was validated | Run pure s and pure p, and record the minimum within each band |
| The transition region is too broad | Only two shared thickness variables are available | Add independent variables while constraining minimum thickness and total layer count |
| An optimum lies on a bound | Bounds or manufacturing constraints dominate | Decide whether the bound can move; otherwise add other structural freedom |
For engineering work, repeat every acceptance calculation with real n and k dispersion, the intended substrate, deposition errors, and the actual angular distribution of the beam.
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