Anisotropic OLED Outcoupling

Ke et al. (2019): a controlled 539 nm comparison of dipole orientation, quantum efficiency, and transport-layer birefringence
AuthorCodex

Simulation method for study on outcoupling characteristics of stratified anisotropic OLEDs

Authors: Xianhua Ke, Honggang Gu, Xuenan Zhao, Xiuguo Chen, Yating Shi, Chuanwei Zhang, Hao Jiang, and Shiyuan Liu

Journal: Optics Express 27(16), A1014–A1029 (2019) · Comparison target: Figures 5, 8, and 10

Changing only the emitting-dipole direction or the extraordinary refractive index of the electron-transport layer (ETL) can alter an OLED's outcoupling, decay rate, and far-field angular distribution. Ke et al. separate these variables into controlled monochromatic sweeps at 539 nm, making the paper a useful method benchmark for anisotropic Emission models. Horizontal electric dipoles (HEDs) lie parallel to the layers; vertical electric dipoles (VEDs) point normal to them.

Independent redraw of the Ke 2019 monochromatic OLED numerical anchors
Independent redraw of the paper's numerical anchors: orientation extrema from Figure 5, VED peak angles from Figure 8, and HED outcoupling endpoints from Figure 10.Numerical source: Ke et al., Optics Express 27, A1014–A1029 (2019), Figures 5, 8, and 10; independently redrawnCC BY 4.0 (independent redraw)

The paper reports HED outcoupling of 37.2% and 26.2% at ETL birefringence Δn=0.4\Delta n=-0.4 and +0.4. Dreapex TMM's five-point sweep gives 36.76% → 25.64%, with endpoint errors below 0.6 percentage points. The VED far-field peak also moves in the reported direction, although its absolute angle is about 6–7° higher.

Prerequisite: Emission Modeling. This case also retains an isotropic VED with a 145 nm ETL and an isotropic HED with a 50 nm ETL to check the orientation contrast reported in Figure 5.

Background

An emitting dipole in a planar OLED couples power into air, the glass substrate, guided modes, absorption, and evanescent channels. HEDs and VEDs couple differently near the metal cathode. A uniaxial organic layer also has different in-plane and normal refractive indices, shifting transverse-magnetic (TM) optical modes and the far-field profile. Transverse-electric (TE) and TM denote polarization components whose electric or magnetic field is normal to the plane of incidence.

Ke et al. use the intrinsic radiative quantum efficiency qq to connect intrinsic radiation to the cavity-modified total decay rate. This page reports only aggregate mode channels directly supported and actually run in Dreapex TMM; it does not infer the paper's separate ITO and organic waveguide channels from an aggregate result.

Mapping the Paper to the TMM Model

Stack (glass output side → Ag)

LayerThicknessOptical constant at 539 nmState
Glass substrate1 mm1.500 + 0iIncoherent; explicit case assumption because the paper omits glass constants
ITO160 nm1.811 + 0.010iPaper Table 1
PEDOT:PSS30 nm1.518 + 0.011iPaper Table 1
HTL / TPD50 nm1.727 + 0.0000319iPaper Table 1
EML / Alq330 nm1.716 + 0iEmissive; paper Table 1
ETL / BCPBaseline 50 nm1.727 + 0.0000319iPaper Table 1; swept in Figures 6–7
Mg:Ag (60:1)100 nm0.305 + 4.926iPaper Table 1
Ag20 nm0.102 + 3.904iPaper Table 1

Every internal layer uses the constant published at 539 nm; no external commercial material database is called. The paper text and Figure 2 use 30 nm Alq3, which is the value retained here.

Emitter and anisotropy

SettingHorizontal-dipole baselineVertical-dipole extensionBirefringent-ETL extension
Emission wavelengthMonochromatic 539 nmSameSame
Emitter positionDelta at relative EML position 0.5SameSame
Dipole orientationParallelPerpendicularParallel
Intrinsic quantum efficiencyq = 1q = 1q = 1
ETL thickness50 nm145 nm50 nm
Ordinary ETL constant1.727 + 0.0000319iSameSame
Extraordinary ETL constantSame as ordinarySame as ordinary2.127 + 0.0000319i, so Δn=+0.4\Delta n=+0.4

Here qq is the dimensionless intrinsic radiative quantum efficiency on 0–1, and Δn=neno\Delta n=n_e-n_o, where nen_e is the extraordinary refractive index along the optical axis and non_o is the ordinary refractive index; both indices are dimensionless. The monochromatic calculation needs only a unit source at 539 nm, not a complete photoluminescence (PL) spectrum; a full electroluminescence (EL) spectrum is also outside this case.

Reproduction Target and Acceptance Criteria

Comparison targetPaper anchorCurrent acceptance basis
Figure 5Monochromatic HED and VED outcoupling extremaVED near 10%; HED substantially higher; representative thickness neighborhood consistent
Figure 8(a)VED angular distribution for ETL Δn=0.4+0.4\Delta n=-0.4…+0.4Peak moves to a higher angle as Δn\Delta n rises; endpoint peak error no greater than
Figure 10(c)HED outcoupling for ETL Δn=0.4+0.4\Delta n=-0.4…+0.4Five points decrease monotonically; absolute endpoint errors against 37.2% / 26.2% no greater than 1.0 pp

The first run must also close the mode fractions to 100% within numerical precision. Dreapex TMM currently reports Waveguide as an aggregate Mode channel; this case does not claim the paper's layer-resolved waveguide partition.

Modeling Path in Dreapex TMM

Structure

Build the eight layers in the tabulated order from the glass output side toward the metal. Use an incoherent 1 mm constant glass layer with n=1.5; use the paper's Table 1 complex constants for every other layer. Mark the EML as emissive and place the emitting sheet at the layer center.

For the birefringent models, change only the ETL index type to Constant Birefringence, keep the ordinary component fixed, and set the extraordinary real part from 1.327 to 2.127, corresponding to Δn=0.4+0.4\Delta n=-0.4…+0.4. The five HED points use a 50 nm ETL; the two VED endpoints use a 145 nm ETL.

Optical settings

Select Mode, Power Dissipation, and Intensity. All three use a single 539 nm wavelength. Set the normalized in-plane-coordinate range to 0–2 with a 0.005 step and the angular range to 0–89° with a step.

Mode provides aggregate channels and normalized decay rate, Power Dissipation resolves TE/TM power over in-plane wave vector, and Intensity provides the angular distribution. For comparison with Figure 8(a), normalize each angular curve to its own peak.

Example Setup

Horizontal-dipole baseline

The downloadable horizontal-dipole isotropic model fixes a 50 nm ETL, horizontal dipoles, and q=1 to check stack direction, boundary treatment, and mode closure.

The Structure page should show the eight-layer stack, incoherent glass, and the centered emissive Alq3 layer. The top-interface arrow in the screenshot marks the primary output direction.

Expanding the EML should reveal the 539 nm monochromatic file, Parallel orientation, relative position 0.5, and delta distribution.

The Propagation 0 and Emission 3 badges on the Optics page confirm that this run selects only the three emission detectors; the single-wavelength input is fixed at 539 nm.

The two footer notices in these screenshots apply only to unconfigured Optimize variables and objectives. They do not block the Run used by this case.
ParameterValue
StructureGlass / ITO / PEDOT:PSS / TPD / Alq3 / BCP / Mg:Ag / Ag
Emitter539 nm, centered delta, Parallel, q=1
DetectorsMode, Power Dissipation, Intensity
Angle0–89°, step
In-plane coordinate0–2, step 0.005

Birefringence endpoints and dipole orientation

The two Structure screenshots below show the HED Δn=0.4\Delta n=-0.4 endpoint and the VED Δn=+0.4\Delta n=+0.4 endpoint. The VED emitter screenshot separately confirms Perpendicular orientation; wavelength, position, and detector settings remain identical to the baseline.

Simulation Results and Comparison with Figures 5, 8, and 10

The chart is repeated here to keep the paper's numerical anchors adjacent to the real-run evidence.

Independent redraw of the Ke 2019 monochromatic OLED numerical anchors
Independent redraw of the paper's numerical anchors: orientation extrema from Figure 5, VED peak angles from Figure 8, and HED outcoupling endpoints from Figure 10.Numerical source: Ke et al., Optics Express 27, A1014–A1029 (2019), Figures 5, 8, and 10; independently redrawnCC BY 4.0 (independent redraw)

Aggregate modes and normalized decay rate

Every Mode result closes to 100% within numerical precision. The isotropic HED baseline first establishes the partition with a 50 nm ETL.

Keeping the HED, ETL thickness, and ordinary constant fixed while increasing the ETL extraordinary index by 0.4 directly reveals the mode redistribution caused by birefringence.

The VED representative point uses the 145 nm ETL discussed for Figure 7. It records that representative state; its difference from the 50 nm HED model cannot be assigned entirely to orientation.

Dreapex TMM aggregate resultHED, isotropic 50 nm ETLHED, ETL Δn=+0.4\Delta n=+0.4VED, isotropic 145 nm ETL
Top Outcoupling31.1761%25.6429%9.8186%
Substrate40.1025%33.2269%34.3037%
Waveguide12.9391%10.6776%12.7442%
Absorption7.3160%6.0560%5.6714%
Evanescent8.4663%24.3966%37.4620%
Normalized decay rate / Purcell factor1.3746941.6670300.920934

Positive ETL birefringence is the strict single-variable comparison: Evanescent rises by 15.93 percentage points, the Purcell factor rises by 21.3%, and Top Outcoupling falls by 5.53 percentage points. The additional decay therefore enters high-in-plane-wave-vector channels rather than increasing visible far-field outcoupling.

HED birefringence sweep against Figure 10(c)

ETL Δn\Delta nPaper HED outcouplingDreapex TMM Top OutcouplingEndpoint error
−0.437.2%36.76%−0.45 pp
−0.234.17%
031.18%
+0.228.25%
+0.426.2%25.64%−0.56 pp

All five points decrease monotonically with Δn\Delta n, and both endpoints pass the ±1.0 pp criterion. Dreapex TMM predicts a total decrease of 11.11 pp, versus 11.0 pp in the paper.

In-plane power dissipation

Power Dissipation shows TE, TM, and total power over the same normalized in-plane coordinate from 0–2. The isotropic HED baseline contains separate peak groups in the radiative, high-index, and high-in-plane-wave-vector regions.

With ETL Δn=+0.4\Delta n=+0.4, a strong high-coordinate peak reaches approximately 12.12 near 1.265; the isotropic baseline's maximum above 1.15 is approximately 0.243. This shift independently supports the large Evanescent increase in Mode.

The VED representative point has zero TE contribution. Its total power is TM-only and reaches approximately 26.20 near 1.07, consistent with the controlled vertical-dipole setting coupling only to TM polarization.

Far-field angular distribution

The Intensity results share the 0–89° grid. The isotropic HED reaches its maximum along the surface normal and decreases monotonically with angle.

The HED with a positively birefringent ETL still peaks at . Its radiative-angle curve nearly overlaps the baseline: total intensity changes by less than 0.4% at both 55° and 80°. At this representative point, birefringence mainly alters high-in-plane-wave-vector dissipation and normalized mode fractions rather than the far-field peak position.

The isotropic VED with a 145 nm ETL is zero at and reaches its maximum at 55°, producing a clear off-axis lobe.

VED peak angle against Figure 8(a)

ETL Δn\Delta nPaper peakDreapex TMM peakPeak error
−0.443.6°50°+6.4°
+0.449.2°56°+6.8°

Both the paper and the simulation move the peak toward a higher angle as birefringence rises from −0.4 to +0.4. Dreapex TMM gives a shift, versus 5.6° in the paper; both absolute endpoints pass the preregistered threshold. The common 6–7° offset shows that the shift is more robust than the absolute angle.

Deviation Analysis

  1. The paper's Table 1 omits the glass constant and thick-glass treatment. This case uses an incoherent 1 mm glass with n=1.5 and k=0; Substrate and Top Outcoupling are sensitive to that boundary choice.
  2. The comparison uses endpoint scalars explicitly reported in the paper, not machine-readable vectors for the complete curves, so it cannot report a normalized root-mean-square error (NRMSE) for curve shape.
  3. Every model uses one delta emitting sheet at the EML center. A recombination-zone distribution would smooth the cavity-position dependence.
  4. The current Mode result aggregates guided power into one channel. The paper's separate ITO and organic waveguide components cannot be recovered from that aggregate number.
  5. A 539 nm monochromatic result does not need PL, but it cannot be extrapolated to broadband EL or color shift.

Further Extensions

  1. Build a two-dimensional sweep over the Figure 6–7 ETL-thickness range and qq sequence to extend the present monochromatic endpoint comparison.
  2. Sweep Δn=0.4+0.4\Delta n=-0.4…+0.4 separately in the HTL to add the layer contrast in Figures 9 and 10(b/d).
  3. Digitize the paper curves into reference CSV files before adding NRMSE and curve-shape thresholds.
  4. Run a sensitivity envelope for glass n=1.49–1.52 and coherent treatment so that boundary-assumption error remains separate from algorithm error.

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