Changelog

3.0.0

Added: Tolerance analysis to assess how manufacturing errors in thickness, refractive index, and other parameters affect optical performance.
Added: Custom acceptance criteria with pass rates, performance distributions, and spectral variation ranges.
Added: Sensitivity and worst-case analysis to identify critical error sources and unfavorable combinations.
Added: Robust optimization to find designs less sensitive to errors, with independent validation.

Added: Peak intensity, peak wavelength, and full width at half maximum (FWHM) calculations, with dedicated result pages and emission spectrum annotations.
Expanded: Absolute emission calculations with luminance, current efficiency, and Blue Index results.
Added: Angular color shift, luminance retention, half-value angle, angular FWHM, and Lambertian factor analysis.
Added: Internal angular distributions showing angular power density in outcoupling, substrate, waveguide, and absorption channels.

Expanded: OLED optimization targets covering spectra, color, efficiency, and angular characteristics.
Added: Multi-start search methods to improve the search for global optima.
Expanded: Measured reflectance, transmittance, and absorptance curves as fitting targets, with AI-assisted column identification.
Added: Synchronized parameter sweeps with parameters changing together or in opposite directions.

Expanded: Reflection and transmission color analysis with Lab, ΔE00, and other metrics.
Expanded: Color temperature and light source quality analysis with correlated color temperature (CCT), Duv, color rendering index (CRI), and color fidelity index (Rf).
Added: ISO 9050 visible light transmittance and reflectance calculations.

Added: The Aulika OLED material database with 17 compounds and 32 material variants.
Expanded: Seven new cases bring the total to 18, covering tolerance analysis, robust optimization, synchronized sweeps, and OLED, QLED, and PeLED designs.

Expanded: Access to saved simulation results for analysis, plus tolerance, sensitivity, and robust optimization operations.

Expanded: 3D structures with custom colors, transparency, and emissive layer display effects.
Expanded: Angle unit and display convention controls for phase and ellipsometry results.
Added: Drag-and-drop loading of model files.
Expanded: Configuration validation with direct navigation from the issue list to the relevant settings.

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